Branch Committee Member Yang Guoqiang

Deputy Director and Researcher, Institute of Chemistry, Chinese Academy of Sciences

Branch Committee Member Shi Fang

Assistant Director of the Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences

Branch Committee Member Zhang Wei

Vice Dean of the School of Microelectronics, Fudan University

Branch Committee Member Zhao Chao

Researcher at the Institute of Microelectronics, Chinese Academy of Sciences

Branch Chair Yang Deren

Director of the State Key Laboratory of Silicon Materials, Zhejiang University

Branch Chair Song Zhitang

Assistant Director of the Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences

Branch Chair Wang Xi

Director of the Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences

Invited Speaker: Zhang Xianmin

Northeastern University Key Laboratory of Materials Anisotropy and Texture, Ministry of Education

Invited Speaker: Xiang Jinjuan

Engineer at the Institute of Microelectronics, Chinese Academy of Sciences

Pan Xingang, Shanghai Bokang Fine Chemical Co., Ltd.

Title of the Report: Polymer Materials in Electron-Beam Photoresists Brief Introduction to the Report: In microelectronic fabrication and nanofabrication processes, electron-beam photoresists are among the most commonly used high-resolution patterning materials for creating graphic masks. The key material in electron-beam photoresists is organic polymers. This paper discusses various polymer materials used in electron-beam photoresists, covering aspects such as the monomer structures of these polymers, their different compositions, molecular weight ranges and distributions, as well as their characterization within electron-beam photoresist systems. It also elucidates how these factors influence the performance of electron-beam photoresists. Furthermore, changes in the lithographic process play a crucial role in determining the behavior of polymer materials during lithography. Finally, the author provides a list of examples.

Invited speaker: Wang Guilei

Engineer at the Leading Process R&D Center, Institute of Microelectronics, Chinese Academy of Sciences

Invited Speaker: Di Zengfeng

Researcher at the Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences