Transmission electron microscope

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Joint Analysis, Testing, and Technology Cooperation Service Platform

Testing instrument

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Product Description

Instrument and Equipment Information
Instrument Name	Transmission electron microscope	Instrument model	FEI Tecnai G 2 F20, OXFORD Energy Dispersive Spectroscopy
Instrument Name	Transmission Electron Microscope	Place of origin and manufacturer	Netherlands/FEI
Affiliated Unit	The Fifth Research Institute of Electronics, Ministry of Industry and Information Technology (China SaiBao Laboratory)	Acquisition time	2013
Placement location	No. 78, West Zhu Village Avenue, Zhu Village Subdistrict, Zengcheng District, Guangzhou City, Guangdong Province	Instrument Status	Normal
Device application range / Instrument measurement range (tolerance)	Application scope: Morphological imaging of samples is performed using absorption contrast; phase analysis of samples is carried out using electron diffraction patterns to determine the sample’s phases and crystal systems; crystal structure and crystal defects are characterized using high-resolution TEM (HRTEM) images; and elemental composition of microregions is analyzed via EDX energy-dispersive X-ray spectroscopy. Main parameters: TEM information resolution: 0.14 nm; TEM magnification: 50X to 1,000,000X; STEM resolution: 0.2 nm; Energy-dispersive spectroscopy resolution: 127 eV.
Whether it is regularly calibrated by a third-party organization	No	CNAS certification obtained.	Yes

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