Atomic Force Microscope

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Joint Analysis, Testing, and Technology Cooperation Service Platform

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Product Description

Instrument and Equipment Information
Instrument Name	Atomic force microscope	Instrument model	Dimension® Icon™
Instrument Name	Atomic Force Microsphere	Place of origin and manufacturer	Germany/Brook
Affiliated Unit	The Fifth Research Institute of the Ministry of Industry and Information Technology (China SaiBao Laboratory)	Acquisition time	2016
Placement location	No. 78, West Zhu Village Avenue, Zhu Village Subdistrict, Zengcheng District, Guangzhou City, Guangdong Province	Instrument Status	Normal
Device application range / Instrument measurement range (tolerance)	Application Scope: In physics, AFM is primarily used to study surface reconstruction, surface topography, surface electronic states, and dynamic processes of semiconductors and metals; perform three-dimensional high-precision measurements at the nanoscale; characterize the surface morphology and physical properties of samples; quantify surface roughness; assess mechanical properties; measure nanoscale electrical properties; analyze the surface structure of superconductors; and determine the charge density in layered materials and their electronic states. Main parameters: X-Y scanning range: 90 µm × 90 µm (typical value), minimum 85 µm; Z-direction scanning range: 10 µm (typical value).
Whether it is regularly calibrated by a third-party agency	No	CNAS certification obtained.	Yes

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