Scanning Electron Microscopy System
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Scanning Electron Microscopy System |
Instrument model |
Cold Cathode Field Emission Scanning Electron Microscope Regulus8230 Thermal Field Emission Scanning Electron Microscope MIRA3 XMH Ion Sputtering Coating System Q150TS Spectrometer Octane Elect Plus Electron Backscatter Diffraction Camera Hikari Plus X-ray Spectrometer Octane Elect Super |
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Scanning Electron Microscope System |
Place of origin and manufacturer |
Germany/Zeiss, etc. |
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Affiliated Unit |
The Fifth Research Institute of the Ministry of Industry and Information Technology (China SaiBao Laboratory) |
Acquisition time |
2019 |
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Placement location |
No. 78, West Zhu Village Avenue, Zhu Village Subdistrict, Zengcheng District, Guangzhou City, Guangdong Province |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
High-resolution observation of the microtopography on material surfaces not only enables the visualization and detection of both organic and inorganic solid materials, but also allows for the examination of surface microfeatures at micrometer- and submicrometer-scale resolutions, as well as qualitative and quantitative analysis of the sample’s chemical composition. At the submicrometer scale, it is possible to perform crystal structure analyses, including crystal orientation studies (such as microstructural analysis, grain boundary characterization, and investigations into deformation and recrystallization), measurement of true grain sizes, strain assessment, phase identification, and research into material failure mechanisms. Parameters: SEM resolution 0.6 nm at 15 kV; energy resolution of the energy-dispersive spectroscope (Mn-Kα): better than 127 eV. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
Yes |
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