Field Emission Scanning Electron Microscope
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Field Emission Scanning Electron Microscope |
Instrument model |
SigmaHD |
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FE-SEM |
Place of origin and manufacturer |
Germany/Zeiss |
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Affiliated Unit |
HuaXin Testing (Wuxi) Co., Ltd. |
Acquisition time |
2015 |
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Placement location |
Building D1, 3rd Floor, No. 200 Linghu Avenue, Xinwu District, Wuxi City, Jiangsu Province |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Applied to the observation and analysis of surface topography of objects as well as the microstructural analysis of materials. Equipped with secondary electron and backscattered electron detectors, with magnification ranging from 16x to 1000kx; accelerating voltage: 0–30kV; and featuring a 100mm² EDS energy-dispersive spectrometer. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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