Desktop BSE Scanning Electron Microscope
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
Other test instruments
Product accessories:
Contact Us
Product Description
|
Instrument and Equipment Information |
|||
|
Instrument Name |
Desktop BSE Scanning Electron Microscope |
Instrument model |
Phenom XL |
|
BSE-SEM |
Place of origin and manufacturer |
Phenom |
|
|
Affiliated Unit |
HuaXin Testing (Wuxi) Co., Ltd. |
Acquisition time |
2018 |
|
Placement location |
Building D1, 3rd Floor, No. 200 Linghu Avenue, Xinwu District, Wuxi City, Jiangsu Province |
Instrument Status |
Normal |
|
Device application range / Instrument measurement range (tolerance) |
CeB6 high-brightness filament, designed for backscattered electron imaging, suitable for both low-vacuum and high-vacuum imaging modes. Magnification range: 50X–100KX. |
||
|
Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
Previous page
Previous page
© 2025 Zhongguancun Integrated Circuit Materials Industry Technology Innovation Alliance
Beijing Public Security Bureau Filing No. 11010102005379
Website construction:China Enterprise DynamicsBeijing