Scanning electron microscope
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Scanning Electron Microscope |
Instrument model |
SU3500 |
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SEM-EDS |
Place of origin and manufacturer |
Hitachi High-Tech Naka Business Site |
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Affiliated Unit |
Shanghai Feiyan Testing Technology Co., Ltd. |
Acquisition time |
July 2016 |
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Placement location |
No. 2999 Panjing Road, Baoshan District, Shanghai City |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Observing the surface morphology of materials at high magnification and performing elemental analysis allows for the measurement of sample dimensions. EDS can provide both qualitative and semi-quantitative elemental analysis of the sample surface. It is commonly used for analyzing material defects, such as coating analysis on wafers and plastic sheets. SEM: Magnification range 6–30K; maximum magnification up to 100,000x. EDS: Semi-quantitative; capable of detecting elements from number 5 to 92. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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