Field Emission Electron Microscope
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Field Emission Electron Microscope |
Instrument model |
SU8100 |
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FE-SEM |
Place of origin and manufacturer |
Hitachi High-Tech Naka Business Site |
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Affiliated Unit |
Shanghai Feiyan Testing Technology Co., Ltd. |
Acquisition time |
December 2019 |
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Placement location |
No. 2999 Panjing Road, Baoshan District, Shanghai City |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Observe the surface morphology of materials at high magnification and perform elemental analysis. The system can measure sample dimensions. It features excellent imaging performance at low accelerating voltages, with a resolution of 0.8 nm at 1 kV; both high- and low-voltage modes are suitable for high-resolution observation. EDS enables qualitative and semi-quantitative elemental analysis of the sample surface. It is commonly used for material defect analysis, such as coating analysis on wafers and plastic sheets. SEM: Magnification range: 20–1000K; EDS: Semi-quantitative, capable of detecting elements from number 4 to 98. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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