Two-dimensional X-ray detector

Category:

Joint Analysis, Testing, and Technology Cooperation Service Platform

Testing instrument

Encapsulation Material Testing Instrument

Product accessories:

Product Description

Instrument and Equipment Information
Instrument Name	Chinese: Two-dimensional X-ray detector	Instrument model	Quadra7
Instrument Name	2D X-Ray Inspection Systems	Place of origin and manufacturer	UK/NORDSON DAGE
Affiliated Unit	The Fifth Research Institute of the Ministry of Industry and Information Technology (China SaiBao Laboratory)	Acquisition time	2019
Placement location	No. 78, West Zhu Village Avenue, Zhu Village Subdistrict, Zengcheng District, Guangzhou City, Guangdong Province	Instrument Status	Normal
Device application range / Instrument measurement range (tolerance)	Application scope: SMT product inspection, PoP BGA inspection; semiconductor inspection, including TSV, Flipchip, and Copper Pillar inspection. Main parameters: Minimum detection limit—160 kV, 20 W, 100 nm (0.100 microns).
Whether it is regularly calibrated by a third-party agency	Yes	CNAS certification obtained.	Yes

Materials Alliance

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