Digital Silicon Crystal Minority Carrier Lifetime Tester
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
Silicon Material Testing Instrument
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Digital Silicon Crystal Minority Carrier Lifetime Tester |
Instrument model |
LT-100C |
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Digital Minority Carrier Lifetime Tester for Silicon Crystal |
Place of Origin and Manufacturer |
Guangzhou Kunde Technology Co., Ltd. |
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Affiliated Unit |
Jiangsu Xinhua Semiconductor Materials Technology Co., Ltd. |
Acquisition time |
February 2019 |
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Placement location |
No. 66, Yangshan Road, Xuzhou Development Zone |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Test range for minority carrier lifetime: 0.5 μs to 6000 μs; resistivity range of samples: ρ > 0.1 Ω·cm (for non-recycled materials); testing speed: 1 minute per wafer; infrared light source wavelengths: 1.06–1.09 μm and 0.904–0.905 μm; high-frequency oscillation source: using a quartz resonator, oscillation frequency: 30 MHz; preamplifier: gain approximately 25, bandwidth 2 Hz–2 MHz. Measurable single-crystal dimensions: Vertical cross-section measurement: diameter 25 mm – 150 mm; thickness 2 mm – 500 mm; Horizontal longitudinal measurement: diameter 5 mm – 20 mm; length 50 mm – 200 mm. Measurement method: Direct reading via dedicated test software system; Test resolution: Minimum resolution of software readings is 0.01 μs. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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