Two-probe resistivity tester
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
Silicon Material Testing Instrument
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Chinese: Two-probe resistivity tester |
Instrument model |
KDY-20 |
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English: None yet |
Place of origin and manufacturer |
Guangzhou Kunde Technology Co., Ltd. |
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Affiliated Unit |
Jiangsu Xinhua Semiconductor Materials Technology Co., Ltd. |
Acquisition time |
February 2019 |
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Placement location |
No. 66, Yangshan Road, Xuzhou Development Zone |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
This instrument is suitable for measuring the resistivity of single-crystal ingots—whether circular, square, or rectangular—with uniform cross-sectional areas. The ratio of the sample length to the maximum dimension of its cross section should be no less than 3:1. The “small-moving probe head,” featuring two probes spaced 1.59 mm apart, exhibits a probe movement rate of less than 0.3%. This ensures high accuracy and repeatability in the instrument’s resistivity measurements. The device is equipped with the KDY measurement system, which is programmed in VC++. It can process and correct resistivity data obtained from both four-probe and two-probe measurements, supports a specific data storage format, displays trend curves, calculates the average of forward and reverse resistivity values, identifies the maximum and minimum resistivity values, and greatly simplifies the measurement process. Compatibility: The instrument is compatible with standard PCs and supports Windows XP, Win7, and Win10. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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