High-speed aging test chamber
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
Other test instruments
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
High-speed aging test chamber |
Instrument model |
R8PC-422R8 |
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English: None yet |
Place of origin and manufacturer |
Japan/Harayama |
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Affiliated Unit |
Hua Jin Semiconductor Packaging Leading Technology R&D Center Co., Ltd. |
Acquisition time |
October 2010 |
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Placement location |
No. 3, Beitucheng West Road, Chaoyang District, Beijing |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Temperature test ranges: 105.0–133.3℃/100% RH; 110.0–140.0℃/85% RH; 118.0–150.0℃/65% RH; Humidity range: 65%-100% RH; Pressure range: 0.019–0.208 MPa; Test duration: 500 hours; Equipped with 20 bias terminals. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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