X-ray detector
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
Other test instruments
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
X-ray detector |
Instrument model |
GE Sensing Microme|x CT |
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English: None yet |
Place of origin and manufacturer |
Germany/Phoenix |
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Affiliated Unit |
Hua Jin Semiconductor Packaging Leading Technology R&D Center Co., Ltd. |
Acquisition time |
December 2009 |
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Placement location |
No. 3, Beitucheng West Road, Chaoyang District, Beijing |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Minimum detection distance: 1 µm; maximum geometric magnification: 2130x; maximum voltage: 180 kV; maximum control current: 0.88 mA at 45 kV; viewing angle: 0–70 degrees. Tabletop rotation angle: 0–360 degrees; tilt angle: +/- 70 degrees tilt / 0–360 degrees rotate. |
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Whether it is regularly calibrated by a third-party agency |
No |
CNAS certification obtained. |
No |
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