Universal Testing Machine
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
Other test instruments
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Universal testing machine |
Instrument model |
AG-X plus 1 kN |
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English: None yet |
Place of origin and manufacturer |
Japan/Shimadzu |
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Affiliated Unit |
Hua Jin Semiconductor Packaging Leading Technology R&D Center Co., Ltd. |
Acquisition time |
November 2013 |
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Placement location |
No. 3, Beitucheng West Road, Chaoyang District, Beijing |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
It performs a variety of performance tests on different materials, including tensile, compressive, bending, peel, and shear tests, and features a wide measurement range, high accuracy, and rapid response. |
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Whether it is regularly calibrated by a third-party agency |
No |
CNAS certification obtained. |
No |
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