Optical Film Thickness Meter
Category:
Polishing Material Testing Instrument
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Optical Film Thickness Meter |
Instrument model |
F50 |
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The Thin-Film Measurement Systems |
Place of origin and manufacturer |
Daimi Co., Ltd. |
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Affiliated Unit |
Shanghai Xin'anna Electronic Technology Co., Ltd. |
Acquisition time |
September 20, 2011 |
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Placement location |
No. 20, Lane 285, Tiangong Road, Jinshan Industrial Zone, Jinshan District, Shanghai Municipality |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
The F50 advanced spectral reflectance system enables quick and easy mapping of film thickness and refractive index. The motorized r-theta stage automatically moves to the selected measurement point and delivers thickness measurements within seconds. You can choose from dozens of predefined polarization rectangular or linear map patterns, or create your own patterns—without any limit on the number of measurement points. The entire desktop system can be set up and ready for use in just a few minutes. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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