Atomic Force Microscope
Category:
Polishing Material Testing Instrument
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Atomic force microscope |
Instrument model |
XE-150 |
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Atomic Force Microscope |
Place of origin and manufacturer |
South Korea/Park |
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Affiliated Unit |
Shanghai Xin'anna Electronic Technology Co., Ltd. |
Acquisition time |
February 9, 2012 |
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Placement location |
No. 20, Lane 285, Tiangong Road, Jinshan Industrial Zone, Jinshan District, Shanghai City |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
An atomic force microscope is an analytical instrument used to study the surface structure of solid materials, including insulators. It investigates the surface structure and properties of a material by detecting the extremely weak interatomic forces between the surface of the sample under examination and a tiny force-sensitive element. One end of a microcantilever—extremely sensitive to weak forces—is fixed, while the tiny tip at the other end is brought close to the sample. At this point, the tip interacts with the sample, and the resulting force causes the microcantilever to deform or undergo a change in its motion state. As the sample is scanned, sensors detect these changes, providing information about the distribution of interaction forces. Consequently, surface topography and surface roughness can be characterized with nanometer-level resolution. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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