Programmable Transistor Characteristic Curve Tracer
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
Encapsulation Material Testing Instrument
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Programmable Transistor Curve Tracer |
Instrument model |
370B |
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Programmable Transistor Plotter |
Place of origin and manufacturer |
United States/Tektronix |
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Affiliated Unit |
The Fifth Research Institute of Electronics, Ministry of Industry and Information Technology (China SaiBao Laboratory) |
Acquisition time |
2008 |
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Placement location |
No. 78, West Zhu Village Avenue, Zhu Village Subdistrict, Zengcheng District, Guangzhou City, Guangdong Province |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Application scope: Testing and analysis of encapsulating materials, electronic components and devices, as well as leakage current testing of materials. Main parameters: Maximum voltage 2000V, leakage current resolution > 1 nA. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
Yes |
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