Inductively Coupled Plasma Emission Spectrometer

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Joint Analysis, Testing, and Technology Cooperation Service Platform

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Product Description

Instrument and Equipment Information
Instrument Name	Inductively Coupled Plasma Emission Spectrometer	Instrument model	5100
Instrument Name	ICP-OES	Place of origin and manufacturer	United States / Aglient
Affiliated Unit	The Fifth Research Institute of Electronics, Ministry of Industry and Information Technology (China SaiBao Laboratory)	Acquisition time	2018
Placement location	No. 78, West Zhu Village Avenue, Zhu Village Subdistrict, Zengcheng District, Guangzhou City, Guangdong Province	Instrument Status	Normal
Device application range / Instrument measurement range (tolerance)	Application scope: Suitable for the quantitative analysis of trace heavy metals in various samples of integrated circuit materials, as well as for rapid qualitative and quantitative analysis. Also suitable for the quantitative analysis of conventional content of major components in metals and inorganic non-metallic minerals, and for rapid qualitative and quantitative analysis. Main parameters: Instrument detection limits (ug/L): Ba 455.403 nm, 0.05; Cd 214.439 nm, 0.1; Cu 324.754 nm, 0.5; Fe 238.204 nm, 0.2; Mg 279.553 nm, 0.02; Pb 220.353 nm, 2.0.
Whether it is regularly calibrated by a third-party agency	Yes	CNAS certification obtained.	Yes

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