Minority Carrier Lifetime Analyzer
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
Silicon Material Testing Instrument
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Childhood Life Span Analyzer |
Instrument model |
FAaST210 |
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SPV |
Place of origin and manufacturer |
United States/SEMILAB |
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Affiliated Unit |
Nanjing Guosheng Electronics Co., Ltd. |
Acquisition time |
2013 |
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Placement location |
No. 166, Zhengfang Middle Road, Jiangning District, Nanjing |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Minority carrier lifetime test on silicon wafers: DL: 1–2000 µm. |
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Whether it is regularly calibrated by a third-party agency |
No |
CNAS certification obtained. |
No |
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