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  • 数字式硅晶体少子寿命测试仪.jpg

Digital Silicon Crystal Minority Carrier Lifetime Tester

Category:

Joint Analysis, Testing, and Technology Cooperation Service Platform

Testing instrument

Silicon Material Testing Instrument

Product accessories:


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Product Description

Instrument and Equipment Information

Instrument Name

Digital Silicon Crystal Minority Carrier Lifetime Tester

Instrument model

LT-100C

Digital Minority Carrier Lifetime Tester for Silicon Crystal

Place of origin and manufacturer

Guangzhou Kunde Technology Co., Ltd.

Affiliated Unit

Luoyang Zhonggu Silicon High-Tech Co., Ltd.

Acquisition time

2017

Placement location

No. 1, West Side of Mudan Avenue, Luolong Science and Technology Industrial Park, Luoyang City

Instrument Status

Normal

Device application range / Instrument measurement range (tolerance)

The minority carrier lifetime of polycrystalline silicon ingots and monocrystalline silicon rods can be measured.

Whether it is regularly calibrated by a third-party agency

Yes

CNAS certification obtained.

Yes