Scanning Electron Microscope

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Joint Analysis, Testing, and Technology Cooperation Service Platform

Testing instrument

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Product Description

Instrument and Equipment Information
Instrument Name	Scanning Electron Microscope	Instrument model	VE-9800
Instrument Name	Scanning Electron Microscope (SEM)	Place of origin and manufacturer	Japan/Keyence
Affiliated Unit	Hangzhou Kebote Filtration Equipment Co., Ltd.	Acquisition time	December 2010
Placement location	No. 6, Dabiao Industrial Park, Heshang Town, Xiaoshan District, Hangzhou City, Zhejiang Province	Instrument Status	Normal
Device application range / Instrument measurement range (tolerance)	Surface morphology analysis; Magnification: 30–10,000x;
Whether it is regularly calibrated by a third-party agency	Yes	CNAS certification obtained.	No

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