Inductively Coupled Plasma Mass Spectrometer
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
Silicon Material Testing Instrument
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Chinese: |
Instrument model |
7700S |
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ICP-MS |
Place of origin and manufacturer |
Agilent Technologies, Inc. of the United States |
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Affiliated Unit |
Jiangsu Xinhua Semiconductor Materials Technology Co., Ltd. |
Acquisition time |
July 2016 |
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Placement location |
No. 66, Yangshan Road, Xuzhou Development Zone |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
The primary application of ICP-MS is chemical elemental analysis, particularly excelling in the analysis of metallic elements. It can also analyze nonmetallic elements such as B, P, and As, making its application range extremely broad. Our company’s ICP-MS is primarily used to detect metallic elements in auxiliary materials such as electronic-grade polysilicon and high-purity reagents. Detection limit and related parameters: Low-mass isotope Be(9): 0.5 ppt; medium-mass isotope In(115): 0.1 ppt; high-mass isotope Bi(209): 0.1 ppt; Oxide Interference: CeO+/Ce+: 1.5% (7700x); 3.0% (7700s); Double-charge interference: ≤3.0% Ce2+/Ce+: Isotope ratio accuracy: 0.1% ≤ RSD (107Ag/109Ag); Mass spectrometry range: 2–260 amu; |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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