Non-metallic film thickness gauge

Category:

Joint Analysis, Testing, and Technology Cooperation Service Platform

Testing instrument

Silicon Material Testing Instrument

Product accessories:

Product Description

Instrument and Equipment Information
Instrument Name	Non-metallic film thickness gauge	Instrument model	3100
Instrument Name	Tohospec	Place of origin and manufacturer	Japan/Dongpeng Technology
Affiliated Unit	Jiangyin Jianghua Microelectronics Materials Co., Ltd.	Acquisition time	2018
Placement location	No. 581, Changshou Yungu Road, Zhouzhuang Town, Jiangyin City, Jiangsu Province	Instrument Status	Normal
Device application range / Instrument measurement range (tolerance)	Non-destructive measurement of the thickness of transparent films such as Si, SiO2, and PR, with an accuracy of up to 10 Å.
Whether it is regularly calibrated by a third-party agency	No	CNAS certification obtained.	No

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