Field Emission Scanning Electron Microscope

Category:

Joint Analysis, Testing, and Technology Cooperation Service Platform

Testing instrument

Process Chemical Testing Instruments

Product accessories:

Product Description

Instrument and Equipment Information
Instrument Name	Field Emission Scanning Electron Microscope	Instrument model	SU8010
Instrument Name	Field Emission Scanning Electron Microscope	Place of origin and manufacturer	Hitachi, Ltd.
Affiliated Unit	Jiangyin Jianghua Microelectronics Materials Co., Ltd.	Acquisition time	2015
Placement location	No. 581, Changshou Yungu Road, Zhouzhuang Town, Jiangyin City, Jiangsu Province	Instrument Status	Normal
Device application range / Instrument measurement range (tolerance)	Primarily used for observing micro-morphology, with a maximum magnification of 2 million times.
Whether it is regularly calibrated by a third-party agency	Yes	CNAS certification obtained.	No

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