+
  • 超景深显微系统.jpg

Super-depth-of-field microscopy system

Category:

Joint Analysis, Testing, and Technology Cooperation Service Platform

Testing instrument

Other test instruments

Product accessories:


Contact Us

Product Description

Instrument and Equipment Information

Instrument Name

Super-depth-of-field microscopy system

Instrument model

VHX-7000

3D-OM

Place of origin and manufacturer

Japan/KEYENCE

Affiliated Unit

HuaXin Testing (Wuxi) Co., Ltd.

Acquisition time

2019

Placement location

Building D1, 3rd Floor, No. 200 Linghu Avenue, Xinwu District, Wuxi City, Jiangsu Province

Instrument Status

Normal

Device application range / Instrument measurement range (tolerance)

It is suitable for observing and capturing objects with high depth of field, large depth of field, and varying tilt angles. It enables comprehensive multi-angle focusing on objects at different heights, ensuring sharp and clear images. It can also be used for synthesizing and measuring 3D images of samples, as well as stitching together panoramic images of larger samples. Magnification: 20X–2000X;

Whether it is regularly calibrated by a third-party agency

Yes

CNAS certification obtained.

No