Super-depth-of-field microscopy system
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
Other test instruments
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Super-depth-of-field microscopy system |
Instrument model |
VHX-7000 |
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3D-OM |
Place of origin and manufacturer |
Japan/KEYENCE |
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Affiliated Unit |
HuaXin Testing (Wuxi) Co., Ltd. |
Acquisition time |
2019 |
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Placement location |
Building D1, 3rd Floor, No. 200 Linghu Avenue, Xinwu District, Wuxi City, Jiangsu Province |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
It is suitable for observing and capturing objects with high depth of field, large depth of field, and varying tilt angles. It enables comprehensive multi-angle focusing on objects at different heights, ensuring sharp and clear images. It can also be used for synthesizing and measuring 3D images of samples, as well as stitching together panoramic images of larger samples. Magnification: 20X–2000X; |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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