EMI scanning table
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
EMI scanning table |
Instrument model |
FLS 102 |
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EMI Scan Station |
Place of origin and manufacturer |
Germany/Langer |
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Affiliated Unit |
Hua Jin Semiconductor Packaging Leading Technology R&D Center Co., Ltd. |
Acquisition time |
March 2012 |
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Placement location |
No. 3, Beitucheng West Road, Chaoyang District, Beijing Municipality |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Scan range: 200 mm × 200 mm × 50 mm; minimum adjustment step: 20 μm. Near-field scanning measurement frequency range: magnetic field 2.5 MHz to 6 GHz; electric field 7 MHz to 3 GHz. 60 μm near-field scanning spatial resolution; ICR series: 150 μm diameter vertical ring magnetic field probe, 150 μm horizontal ring magnetic field probe, and 150 μm × 35 μm electric field probe; A 1Ω direct-coupled probe for chip pin current measurement; a 150Ω direct-coupled probe for chip pin voltage measurement. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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