Microprobe stage
Category:
Joint Analysis, Testing, and Technology Cooperation Service Platform
Testing instrument
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Microprobe stage |
Instrument model |
SUMMIT 11000B-S |
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Microwave Probe Station |
Place of origin and manufacturer |
Germany/Cascade |
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Affiliated Unit |
Hua Jin Semiconductor Packaging Leading Technology R&D Center Co., Ltd. |
Acquisition time |
December 2011 |
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Placement location |
No. 3, Beitucheng West Road, Chaoyang District, Beijing Municipality |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
With a wafer probing capability of 200 mm; Suitable for RF characterization testing of devices and wafer-level reliability testing; By installing probes of different specifications, transmission lines with varying line spacings (50 μm–1250 μm) and different structures—such as GS/SG, GSG, and GSSG—can be tested. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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