Focused Ion Beam

Category:

Joint Analysis, Testing, and Technology Cooperation Service Platform

Testing instrument

Silicon Material Testing Instrument

Product accessories:

Product Description

Instrument and Equipment Information
Instrument Name	Focused Ion Beam	Instrument model	FEI DB835
Instrument Name	FIB	Place of origin and manufacturer	United States/Thermo Fisher
Affiliated Unit	Wuxi China Resources Shanghua Technology Co., Ltd.	Acquisition time	2009
Placement location	No. 8, Xinzhou Road, Xinwu District, Wuxi City, Jiangsu Province	Instrument Status	Normal
Device application range / Instrument measurement range (tolerance)	Fine cutting of silicon material defects; Cutting accuracy: <1 µm.
Whether it is regularly calibrated by a third-party agency	No	CNAS certification obtained.	No

Materials Alliance

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