Ultrasound scanning microscope

Category:

Joint Analysis, Testing, and Technology Cooperation Service Platform

Testing instrument

Encapsulation Material Testing Instrument

Product accessories:

Product Description

Instrument and Equipment Information
Instrument Name	Ultrasonic Scanning Microscope	Instrument model	Vue 400-P
Instrument Name	CSAM	Place of Origin and Manufacturer	United States/OKOS
Affiliated Unit	Jiangsu Huahai Chengke New Materials Co., Ltd.	Acquisition time	2018
Placement location	No. 66, Dongfang Avenue, Economic and Technological Development Zone, Lianyungang City, Jiangsu Province	Instrument Status	Normal
Device application range / Instrument measurement range (tolerance)	It is used to detect cracks, delamination, voids, porosity, and other internal defects in materials, as well as to identify impurity particles, inclusions, precipitates, and other foreign substances within the material. It can also be employed to study the crystal lattice structure of materials.
Whether it is regularly calibrated by a third-party agency	No	CNAS certification obtained.	No

Materials Alliance

Phone:(010) 82359930

Beijing Public Security Bureau Filing No. 11010102005379