Atomic Force Microscope
Category:
Polishing Material Testing Instrument
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Atomic force microscope |
Instrument model |
uses AFM |
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AFM |
Place of origin and manufacturer |
United States/bruker |
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Affiliated Unit |
Hubei Dinghui Microelectronics Materials Co., Ltd. |
Acquisition time |
2018 |
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Placement location |
No. 1, Dongjinghe Road, Economic and Technological Development Zone, Wuhan City, Hubei Province |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Scan the surface topography of 8-inch/12-inch wafers. |
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Whether it is regularly calibrated by a third-party agency |
No |
CNAS certification obtained. |
No |
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