Nanoparticle Size Analyzer
Category:
Silicon Material Testing Instrument
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Nanoparticle Size Analyzer |
Instrument model |
NiComp 380 ZLS |
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NiComp 380 ZLS |
Place of origin and manufacturer |
United States/PSS Company |
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Affiliated Unit |
Shanghai Xin'anna Electronic Technology Co., Ltd. |
Acquisition time |
February 9, 2010 |
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Placement location |
No. 20, Lane 285, Tiangong Road, Jinshan Industrial Zone, Jinshan District, Shanghai Municipality |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
By integrating Dynamic Light Scattering (DLS) and Electrophoretic Light Scattering (ELS) technologies, it is possible to simultaneously perform multi-angle measurements for analyzing the particle size and size distribution of liquid nanoparticle systems, as well as to measure the Zeta potential at small angles. The particle size measurement range is from 0.3 nm to 6 μm. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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