Helium Ionization Gas Chromatograph
Category:
Electronic gas testing instrument
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Helium Ionization Gas Chromatograph |
Instrument model |
GC-PDD 2018 |
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GC-PDD |
Place of origin and manufacturer |
Shanghai, China / GenTech |
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Affiliated Unit |
Shanghai Zhengfan Technology Co., Ltd. |
Acquisition time |
2018 |
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Placement location |
No. 55, Chunyong Road, Xin Zhuang Industrial Zone, Shanghai (201108) |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Suitable for trace impurity analysis in high-purity N2, H2, O2, Ar, and He (including H2, O2/Ar, N2, CH4, CO, CO2, etc.), with a detection range of 1 ppb to 1000 ppm. Also applicable to the analysis of various trace impurities in other high-purity electronic specialty gases (such as PH3, AsH3, SiH4, GeH4, NH3, HCl, Cl2, etc.). |
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Whether it is regularly calibrated by a third-party agency |
No |
CNAS certification obtained. |
No |
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