S-3400N Scanning Electron Microscope
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Process Chemical Testing Instruments
Product accessories:
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Product Description
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Instrument and Equipment Information |
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Instrument Name |
Chinese: S-3400N Scanning Electron Microscope |
Instrument model |
S-3400N |
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SEM S-3400N |
Place of origin and manufacturer |
Hitachi |
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Affiliated Unit |
Kunshan Xingu Microelectronics Materials Co., Ltd. |
Acquisition time |
2014 |
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Placement location |
No. 219, Qinfeng North Road, Qiandeng Town, Kunshan City, Jiangsu Province |
Instrument Status |
Normal |
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Device application range / Instrument measurement range (tolerance) |
Morphological analysis of test wafers. Analysis of photoresist removal capability. Performance analysis of etching solutions. Elemental analysis of materials, etc. Instrument measurement range: 100–10,000x. |
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Whether it is regularly calibrated by a third-party agency |
Yes |
CNAS certification obtained. |
No |
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